Compact Electromagnetic Nondestructive Assessment (CENA) Probe is a handheld High Sensitivity RF Probe. It is used for nondestructive evaluation of materials for property and defect inspection.
Innovating Material Measurements
Our CENA Probe provides unique capabilities in non-destructive measurements of advanced materials. It is not only ergonomic, but it also boasts a wide bandwidth range and a high sensitivity level. Some additional features include:
- handheld operation,
- high polarization purity,
- calibration and verification standards,
- a simple graphical user interface,
- and Class 1 Division II operation certification.
Applications
This product is perfect for any application where material characteristics need to be measured easily and with high accuracy. Here are some specific use cases.
- Production Line Inspection
- Subsurface Composite and Metallic Defects
- Maintenance Inspection
- Material Measurements
Specifications
Frequency
6.5-14 GHz
Dynamic Range
35-50 dB
Frequency Points
51-1601
Dimensions
7"x3"x4"
IF Bandwidth
100-10000 Hz
Weight
<3 lbs
Our Headquarters
Voice
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